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Keep Your Process Up to Speed 100% Inspection for Metal Fabrication of Tubes, Bars, and Rods Scanning and Monitoring for Ore Grade Control in Mining Fast and Accurate Elemental Analysis for Continuous Quality Control Easily Integrates into a Variety of Production Systems Rugged for Greater Uptime in Manufacturing Environments
10 cm × 7.9 cm × 26.6 cm 2.4KG
New Olympus Vanta iX In-Line XRF Analyzer - Sale !! For geological processing and mining, the Vanta iX analyzer enables core scanning and on-belt analysis with real-time results to monitor process variability and ensure ore grade consistency. During on-belt analysis, the analyzer provides blending verification and process validation of concentrates.
1、Vanta iX In-Line XRF Analyzer for Automated Material Analysis
Keep Your Process Up to Speed
The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line:
Delivers instant results for real-time process monitoring and 100% inspection
Built to operate 24/7
Configured to deliver pass/fail results, accurate grade ID, and material chemistry
2、100% Inspection for Metal Fabrication of Tubes, Bars, and Rods
For organizations adopting Industry 4.0 practices and 24/7 process control to verify alloys with pass/fail analysis, the Vanta iX analyzer delivers material verification and lot/heat control for bar, billet, tube, and rod manufacturing, as well as machined parts and customized components. Automating your testing with a Vanta iX analyzer adds a competitive edge to your finished product since you can demonstrate that materials are 100% tested and verified.
3、Scanning and Monitoring for Ore Grade Control in Mining
For geological processing and mining, the Vanta iX analyzer enables core scanning and on-belt analysis with real-time results to monitor process variability and ensure ore grade consistency. During on-belt analysis, the analyzer provides blending verification and process validation of concentrates.
4、Fast and Accurate Elemental Analysis for Continuous Quality Control
Like all Vanta electronics, the Vanta iX analyzer works fast while delivering reliable, actionable results to guide critical decisions.
High resolution: ID a range of alloy grades—including light and heavy elements
Fast, accurate results: the analyzer’s electronics provide high throughput, stability, and count rate
Efficient: features a silicon drift detector (SDD) and the proven Axon Technology™ found in every Vanta analyzer
5、Easily Integrates into a Variety of Production Systems
The Vanta iX analyzer is versatile, compact, and easy to install—use the mounting holes on each side to mount the analyzer onto robotics and other systems. There is no external control box, so you can easily control the analyzer with either the Vanta Connect API or a PLC and discrete wire.
Connector options:
Ethernet (RJ-45), enabling Power over Ethernet
USB
Discrete I/O (16 pins)
AUX DC power
6、Rugged for Greater Uptime in Manufacturing Environments
The Vanta iX analyzer is built to endure the high levels of vibration, electromagnetic and acoustical noise, dust, and moisture of production facilities for increased reliability and uptime.
Vibration tested (MIL-STD)
IP54 rated
Designed to operate from –10 °C to 50 °C (14 °F to 122 °F) with continuous testing
A built-in heat sink lowers the internal temperature, while fan attachment points are available if additional cooling is needed. The analyzer offers toolless window changes for fast maintenance.
Vanta iX Specifications
| Brand | Olympus |
| type | Vanta iX In-Line XRF Analyzer |
| Dimensions (W × H × D) | 10 cm × 7.9 cm × 26.6 cm (3.9 in. × 3.1 in. × 10.5 in.) |
| Weight | 2.4 kg (5.29 lb) |
| Excitation Source | X-ray tube: Rh or W anode (application optimized) 5–200 μA MR model: 8–50 keV (4 W max) CW model: 8–40 keV (4 W max) |
| Primary Beam Filtration | Eight filter positions automatically selected per beam per method |
| Detector | MR model: Large-area silicon drift detector CW model: Standard silicon drift detector |
| Power | Power over Ethernet (PoE) or 18 V AC power adaptor |
| Elemental Range | Method dependent: MR model: Mg–U CW model: Ti–U (with standard window and calibration) |
| Pressure Correction | Built-in barometer for automatic altitude and air pressure correction |
| IP Rating | IP 54 |
| Operating Environment | Temperature range: –10 °C to 50 °C (14 °F to 122 °F) under continuous duty cycle Humidity: 10% to 90% relative humidity, non-condensing |
| Operating System | Linux |
| Application Software | Olympus proprietary data acquisition and processing package |
| Availability: | 50 pce |
