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High Absorbance Dynamic Range (高吸光度动态范围), Optical Coatings & Thin Film Testing (光学镀膜与薄膜检测), Universal Measurement Accessory UMA (UMA通用测量附件), Integrating Sphere Optics (积分球光学系统), Semiconductor & Solar Cell Analysis (半导体与太阳能电池分析), Material Science Research (材料科学研究)
Measuring the Performance of Compact Visual Displays Multi-angle UV-Vis-NIR measurements of multiple layer optical coatings High Volume Optical Component Testing Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements Investigation of Dichroism by Spectrophotometric Methods Spectrophotometric Methods of Refractive Indices Measurement Optical Characteristics and Thickness of 2-layered Structures Optical characterization of thin films using a new Universal Measurement Accessory for the Agilent Cary UV-Vis-NIR spectrophotometers Automated, unattended multi-angle transmission and absolute reflection measurements on architectural and automotive glass
Agilent Cary Series UV-Vis-NIR Spectrophotometers
Agilent Cary 5000
Agilent Cary 6000i
Agilent Cary 4000
Agilent Cary 7000
Cary 5000 Spectrophotometer
Agilent UV-Vis-NIR Spectrophotometer
Cary 5000 UV-Vis-NIR Spectrophotometer from Agilent Technologies
The Cary 5000 is a high-performance UV-Vis and NIR spectrophotometer with superb photometric performance in the 175–3300 nm range. Using a PbSmart detector, the Cary 5000 extends its NIR range to 3300 nm making it a powerful tool for materials science research. The Cary WinUV software, a modular Windows-based software, makes it easy to perform powerful analysis and control a number of optional accessories.
The large sample compartment can be expanded to hold large accessories and integrating spheres for spectral and diffuse reflectance. The LockDown mechanism makes it possible to quickly change and position accessories for reproducible results.
Features
Measure beyond 8.0 absorbance units with reference beam attenuation
Measure 175 to 3300 nm using a PbSmart NIR detector for extended photometric range
WinUV software—modular software with power analysis and enhanced transfer and report export capabilities
Versatile set of accessories for materials research including spectral and diffuse reflectance
Variable slit widths (down to 0.01 nm) for optimum control over data resolution
Large sample compartment with LockDown mechanism for quick changes and positioning for reproducible results
Maximum light throughput using Schwarzchild coupling optics for higher accuracy at low transmission levels
Minimal noise and stray light using a floating aluminum casting and double Littrow monochromator
Extended dynamic range by attenuating the reference beam to balance double beam signal levels.
Nitrogen purging—separate purging in the sample and monochromator compartments to reduce oxygen and water vapor in the ultra-violet.
| Item | Cary 5000 UV-Vis-NIR Spectrophotometer |
| Catalog Number | 10079300 |
| Application | UV-Vis-NIR measurements in thin films, optics, glass, semiconductors, advanced materials & nanomaterials. |
| Dimensions | ( WxDxH) 1020 x 710 x 380 mm |
| Light Source | Tungsten halogen visible and deuterium arc UV |
| Optical System | Double Beam |
| Scanning Speed | UV-Vis 2000 nm/min; NIR 8000 nm/min |
| Spectral Range | UV-Vis 0.01 to 5.00 nm; NIR 0.04 to 20 nm |
| Type | UV-VIS-NIR |
| Features | Nitrogen purging, large sample compartment, LockDown mechanism for quick changes and positioning |
| Weight | 91 Kg |
| Wavelength Range | 175 to 3300 nm |
Cary 6000i UV-Vis-NIR Spectrophotometer from Agilent Technologies
The Cary 6000i UV-Vis-NIR spectrophotometer has been tailored for unmatched photometric performance in the short-wave infrared (SWIR) 800–1800 nm range as well as the UV-visible 175 to 800 nm. Using narrow-band InGaAs detection and a 600 lines-per-mm diffaction grating for improved SWIR sensivity, the Cary 6000i is the ultimate tool for materials characterization spectroscopy.
Using Cary WinUV software with the Cary 6000i makes it easy to perform powerful analysis and control optional accessories. The large sample compartment can be expanded to hold large accessories and integrating spheres for spectral and diffuse reflectance. The LockDown mechanism makes it possible to quickly change and position accessories for reproducible results.
Features
Measure beyond 8.0 absorbance units with reference beam attenuation
Measure 175 to 1800 nm using a narrow-band InGaAs detector and 600 l/mm NIR diffraction gratings for unmatched sensivity in the short-wave infrared
WinUV software—modular software with power analysis and enhanced transfer and report export capabilities
Versatile set of accessories for materials research including spectral and diffuse reflectance
Variable slit widths (down to 0.01 nm) for optimum control over data resolution
Large sample compartment with LockDown mechanism for quick changes and positioning for reproducible results
Maximum light throughput using Schwarzchild coupling optics for higher accuracy at low transmission levels
Minimal noise and stray light using a floating aluminum casting and double out-of-plane Littrow monochromator
Extended dynamic range by attenuating the reference beam to balance double beam signal levels.
Nitrogen purging—separate purging in the sample and monochromator compartments to reduce oxygen and water vapor in the ultra-violet.
| Item | Cary 6000i UV-Vis-NIR Spectrophotometer |
| Catalog Number | 10079400 |
| Application | Analysis of the functionality of photoresists, Analysis of novel nanocomposite materials, Colour measurements and colour matching |
| Dimensions | 1020 x 380 x 710 mm |
| Light Source | Mercury lamp |
| Optical System | Double out-of-plane Littrow monochromator |
| Scanning Speed | UV-Vis 2,000 nm/min; NIR 8,000 nm/min |
| Spectral Range | UV-Vis 0.01 to 5.00 nm; NIR 0.04 to 20 nm |
| Type | UV-VIS-NIR |
| Features | Large expandable sample compartment, LockDown mechanism for quick changes and positioning |
| Weight | 91 Kg |
| Detector(s) | PbS or InGaAs photodiode |
| Resolution | UV/Vis less than 0.05; NIR less than 0.1 |
| Wavelength Range | 175 to 1800 nm |
Universal Measurement Spectrophotometer (UMS) – Agilent Technologies Cary 7000 UV-VIS-NIR
The Cary 7000 Universal Measurement Spectrophotometer (UMS) is an all-encompassing device used for reflection, transmission, and absorption measurements from the near IR range all the way to UV. With the Cary 7000 computer interface, this device is easy to use, while maintaining functionality. The Cary 7000 UMS system is composed of a conventional Cary 5000 spectrophotometer unit and a UMA accessory unit.
Features
Measurement modes:
Abs mode – display data in absorbance units, up to 10 Abs range
%T mode – display the photometric value in percent transmission mode, direct transmission (180°) and variable angle transmission from 0° to 180° in 0.02° intervals
%R mode – display the photometric value in percent reflectance mode, used in Diffuse Reflectance on rough sample surface, independent sample rotation (360°) and detector positioning (10°–350°) at 0.02° internals
Absolute %R mode – display the collected data as the square root of the %R value, used in Specular Reflectance on a smooth sample surface, variable angle from 5° to 85° in 0.02° intervals
2 Monochromators: double out-of-plane Littrow monochromator
2 Gratings: 70 x 45 mm
UV-Vis: Ruled line diffraction grating, 1200 l/mm blazed at 250 nm
NIR: Ruled line diffraction grating, 300 l/mm blazed at 1192 nm
3 Detectors:
On Cary 5000 unit: R928 PMT (UV-Vis), Cooled PbSmart PbS (NIR)
On UMA unit: two-colored Si/InGaAs detector (UV-Vis and NIR)
2 Light sources:
Deuterium lamp: 190 – 350 nm
Halogen lamp: 350 – 3300 nm
* A third light source of mercury lamp is also installed but only used for Performance Test during maintenance
Beam splitting system: Rotating beam splitter, measure a sample, dark and reference signal per cycle with a speed of 30 Hz
Auto-polarizer: p and s polarization
Cary 5000 unit wavelength range (nm):
175 nm – 3300 nm
N2 purge required below 185 nm
UMA unit wavelength range (nm):
Without auto-polarizer: 190 – 2800 nm
With auto-polarizer: 250 – 2500 nm
Wavelength changeovers:
Light source changeover: 320 nm
Detector changeover: 1050 nm
Grating changeover: 720 nm
Limiting resolution (nm):
UV-Vis: <0.048 nm
NIR: <0.2 nm
Spectral bandwidth SBW (nm): 2 nm recommended
UV-Vis: 0.01 – 5.00 nm, 0.01 nm steps
NIR: 0.04 – 20 nm
Signal averaging time (sec): 0.033 – 999 sec
Maximum scan rate (nm/min)
UV-Vis: 2000 nm/min
NIR: 8000 nm/min
Slew rate (wavelength changeover speed, nm/min)
UV-Vis: 16000 nm/min
NIR: 64000 nm/min
Data interval:
UV-Vis: 0.005 – 1.111 nm, 1.627 – 17.335 cm-1, 0.05 – 11.1 Å
NIR: 0.02 – 4.444 nm, 0.3145 – 4.0753 cm-1, 0.2 – 44.44 Å
* Interval range is dependent upon scan range
Repetitive scanning:
Maximum number of cycles: 999
Maximum cycle time (min): 9999
Baseline correction
Sample size:
5 mm minimum to 275 mm maximum
255 mm if detector slide mount is installed
235 mm if a depolarizer is mounted in detector slide mount
Maximum physical thickness: 30 mm using standard supplied sample holder
UMA unit aperture masks: 1, 2 and 3 degrees (H and V) for incident beam
